Averill Park, NY, United States of America

Paul Dickson McKee

This inventor holds 1 USPTO granted patent. Top assignee: Rensselaer Polytechnic Institute. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Paul Dickson McKee. Retrieved from https://idiyas.com/inventor/paul-dickson-mckee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Paul Dickson McKee and the StarNAV Optical Sensor System.

Introduction

Paul Dickson McKee is an inventor associated with Rensselaer Polytechnic Institute in Averill Park, New York. His work includes a patent for a spacecraft navigation system that uses starlight to estimate instantaneous velocity.

Latest Patents

McKee is credited with 1 patent, titled “StarNAV Optical Sensor System.” The invention describes a method for estimating a spacecraft’s instantaneous velocity from a selected image of a star field. It identifies pairs of stars, estimates the apparent bearing direction of stars in those pairs, and determines the apparent angle between each pair. A velocity estimation module then uses those inter-star angles to estimate the spacecraft’s velocity within a total velocity error.

Career Highlights

The StarNAV patent highlights McKee’s contribution to optical spacecraft navigation. By using observed star positions and angular relationships, the system offers a way to derive velocity information from starlight.

Collaborations

McKee’s listed coworkers include John Allen Christian and Michael Kudenov. His association with Rensselaer Polytechnic Institute connects the invention to the university’s research and innovation community.

Conclusion

Paul Dickson McKee’s StarNAV patent applies star-field observations to spacecraft velocity estimation, illustrating how optical sensing can support navigation in space.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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