IE

Paul Devereaux

This inventor holds 0 USPTO granted patents, plus 3 CIPO patents.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Paul Devereaux. Retrieved from https://idiyas.com/inventor/paul-devereaux

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

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Title: Paul Devereaux: Innovator in Nickel-Titanium Alloys

Introduction

Paul Devereaux is a notable inventor based in Ireland, recognized for his contributions to the field of materials science. He has developed a unique nickel-titanium alloy that incorporates rare earth elements, showcasing innovative properties suitable for medical applications.

Latest Patents

Although Paul Devereaux currently holds no patents, his work on the nickel-titanium alloy is significant. The alloy comprises nickel, titanium, and at least one rare earth element, selected from a comprehensive group including La, Pr, Nd, and others. This alloy is designed to contain between 34 at.% to 60 at.% nickel and titanium, along with 0.1 at.% to 15 at.% of the rare earth element. The alloy not only exhibits radiopacity but also demonstrates superelastic or shape memory behavior, making it ideal for medical devices.

Career Highlights

Paul Devereaux is associated with Cook Medical Technologies LLC, where he applies his expertise in developing advanced materials for medical applications. His work focuses on enhancing the performance and functionality of medical devices through innovative alloy compositions.

Collaborations

Paul collaborates with talented professionals such as James M Carlson and Shane Carr, contributing to the advancement of medical technology through teamwork and shared expertise.

Conclusion

Paul Devereaux's work in developing nickel-titanium alloys with rare earth elements represents a significant advancement in materials science, particularly for medical applications. His innovative approach continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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