Woodinville, WA, United States of America

Paul D Berndt


Average Co-Inventor Count = 2.5

ph-index = 4

Forward Citations = 69(Granted Patents)


Company Filing History:


Years Active: 2001-2008

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4 patents (USPTO):Explore Patents

Title: Paul D. Berndt: Innovator in Integrated Circuit Testing

Introduction

Paul D. Berndt is a notable inventor based in Woodinville, WA (US), recognized for his contributions to the field of integrated circuit testing. With a total of 4 patents to his name, Berndt has made significant advancements that enhance the efficiency and effectiveness of testing high-speed devices.

Latest Patents

One of Berndt's latest patents is focused on the "Scan testing of integrated circuits with high-speed serial interface." This invention involves an integrated circuit that includes a serial link interface designed to send and receive data over a serial bus during both normal operation and scan tests. The integrated circuit features data routing circuitry that facilitates data transfer between the serial link interface and a scan chain during tests, as well as between the serial link interface and the core logic circuit during normal operation. This innovation allows for the generation and analysis of scan data by a tester integrated circuit connected to the integrated circuit via the serial bus.

Another significant patent is the "Apparatus and method to test high-speed devices with a low-speed tester." This invention describes an apparatus that connects a low-speed tester to a device that operates at a higher speed. The apparatus enables the low-speed tester to conduct high-speed tests on the device, thereby bridging the gap between different testing speeds.

Career Highlights

Paul D. Berndt is currently employed at Cypress Semiconductor Corporation, where he continues to develop innovative solutions in the semiconductor industry. His work has been instrumental in advancing testing methodologies for integrated circuits.

Collaborations

Throughout his career, Berndt has collaborated with several talented individuals, including Steven Philip Larky and Jarie G. Bolander. These collaborations have contributed to the successful development of his patented technologies.

Conclusion

Paul D. Berndt's contributions to integrated circuit testing demonstrate his commitment to innovation and excellence in the field. His patents not only enhance testing capabilities but also pave the way for future advancements in semiconductor technology.

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