Palatine, IL, United States of America

Paul C Lee

This inventor holds 1 USPTO granted patent. Top assignee: G.d. Searle & Company. Active years: 1977.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Paul C Lee. Retrieved from https://idiyas.com/inventor/paul-c-lee-68844bdh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 1977

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1 patent (USPTO):Explore Patents

Title: Paul C. Lee and His Patent for a Gantry Scanning Camera.

Introduction

Paul C. Lee is an inventor associated with Palatine, Illinois, and G.D. Searle & Company. His recorded patent concerns a scintillation camera system designed to capture images across an expanded field of view.

Latest Patents

Lee is credited with 1 patent, titled “Gantry Scanning Camera.” The invention suspends a scintillation camera from an elevated gantry and allows it to move laterally. Sensors track the detector head’s position, and their signals are combined with the camera’s output to create an image showing radioactive events across an expanded rectilinear field of view. The image is then stored on a recording medium.

Career Highlights

Lee’s patent reflects work on imaging technology that combines detector movement and position sensing to extend the area represented in a scan. The available information identifies G.D. Searle & Company as his company affiliation.

Collaborations

Lee’s listed coworkers include Ronald E. Turcotte and Jay R. Wolff. Their names are associated with his professional context, though the available details do not specify their roles in the patent.

Conclusion

Paul C. Lee’s “Gantry Scanning Camera” patent describes a system that expands scintillation-camera imaging through lateral movement and position-aware image recording.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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