Renton, WA, United States of America

Paublas M Tarango

This inventor holds 1 USPTO granted patent. Top assignee: Zetec, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Paublas M Tarango. Retrieved from https://idiyas.com/inventor/paublas-m-tarango

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Paublas M Tarango: Innovator in Eddy Current Probe Technology

Introduction

Paublas M Tarango is an accomplished inventor based in Renton, WA (US). He has made significant contributions to the field of eddy current probe technology. His innovative designs have led to advancements that enhance the functionality and reliability of these essential tools.

Latest Patents

Paublas holds a patent for an "Adjustable Centering Feet Assembly for Eddy Current Probe." This invention features a centering assembly that includes a foot element with multiple resilient cantilevered legs. These legs project radially around a central aperture, and an adjustment element is movable relative to the foot element. This design allows for the exertion of a radial force on the legs, ensuring that the outside diameter remains consistent even as the legs wear down during use. Paublas has 1 patent to his name.

Career Highlights

Paublas M Tarango is currently employed at Zetec, Inc., where he continues to innovate and develop new technologies. His work has been instrumental in improving the performance of eddy current probes, which are widely used in various industries for non-destructive testing.

Collaborations

Paublas collaborates with his coworker, Evan Lloyd, to further enhance their projects and share insights in their field of expertise.

Conclusion

Paublas M Tarango is a notable inventor whose work in eddy current probe technology has made a lasting impact. His innovative solutions continue to advance the industry and improve testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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