This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Trioptics Gmbh. Active years: 2018.
Company Filing History:
Years Active: 2018
Title: Innovations by Patrik Erichsen
Introduction
Patrik Erichsen is a notable inventor based in Hetlingen, Germany. He has made significant contributions to the field of optical systems through his innovative patent. His work focuses on enhancing the measurement of optical characteristics, which is crucial for various applications in technology and research.
Latest Patents
Patrik holds a patent for an "Apparatus and method for measuring a wavelength-dependent optical characteristic of an optical system." This invention features a light-pattern generation device that produces a pattern of polychromatic light in an object plane. The apparatus includes a measuring optical unit that images the object plane onto a spatially resolving light sensor. A dispersive optical element is strategically placed in the light path to generate multiple images of the pattern with different wavelengths simultaneously on the light sensor. The evaluation device then determines the wavelength-dependent characteristic of the optical system from these images. This innovative approach allows for more accurate and efficient measurements in optical systems.
Career Highlights
Patrik is currently employed at Trioptics GmbH, where he continues to develop and refine his inventions. His work at the company has positioned him as a key player in advancing optical measurement technologies. With a focus on practical applications, he has contributed to the growth and success of the organization.
Collaborations
Patrik collaborates with talented individuals such as Aiko Ruprecht and Daniel Winters. Their combined expertise fosters a creative environment that drives innovation and enhances the development of new technologies.
Conclusion
Patrik Erichsen's contributions to the field of optical systems through his patent demonstrate his commitment to innovation. His work not only advances technology but also sets a foundation for future developments in optical measurements.
