Muelheim, Germany

Patrick Weßkamp

This inventor holds 1 USPTO granted patent. Top assignee: Krohne Messtechnik Gmbh. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Patrick Weßkamp. Retrieved from https://idiyas.com/inventor/patrick-weßkamp-1jst3oto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Patrick Weßkamp

Introduction

Patrick Weßkamp is a notable inventor based in Muelheim, Germany. He has made significant contributions to the field of automation technology. His work focuses on enhancing the security and efficiency of access control systems in field devices.

Latest Patents

Patrick Weßkamp holds a patent for a method designed to change an existing access key in a field device within automation technology. This innovative method involves several steps, including providing a key database on a database server, generating a key data set for authorized users, and transferring this key data set to the control unit of the authorized user. The key database supports multiple field devices and contains essential information such as field device identifiers, existing access keys, and user identifiers.

Career Highlights

Patrick Weßkamp is currently employed at Krohne Messtechnik GmbH, a company known for its expertise in measurement technology. His role at the company allows him to apply his innovative ideas and contribute to advancements in automation technology.

Conclusion

Patrick Weßkamp's work exemplifies the importance of innovation in automation technology. His patent reflects a commitment to improving security and efficiency in access control systems. His contributions are valuable to the industry and highlight the ongoing need for advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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