Patrick Vanhee

Title: Patrick Vanhee: Innovator in Metal Detection Technologies

Introduction

Patrick Vanhee is a notable inventor based in Briey, France. He has made significant contributions to the field of metal detection technologies, holding 2 patents that showcase his innovative approach to solving industry challenges.

Latest Patents

One of his latest inventions is an apparatus for detecting surface defects on a running metal strip. This apparatus includes means for illuminating the area of the strip to be inspected, at least one pair of cameras that periodically capture images of the same portion of the area, and a computing unit that reconstructs a stereoscopic image from the images provided by the cameras. The system is designed to detect objects exhibiting a relief greater than a predetermined threshold, analyze these images, and display the results to the operator.

Another significant patent is a device for measuring the thickness profile of a metal product. This device is designed for moving strips or plates and includes an X-ray source, an X-ray detection unit, and means for processing the signals emitted by the detection unit. The design ensures that the detection unit and processing means are efficiently arranged for optimal performance.

Career Highlights

Throughout his career, Patrick Vanhee has worked with prominent companies, including Sollac. His experience in these organizations has contributed to his expertise in metal detection technologies and innovation.

Collaborations

Patrick has collaborated with notable professionals in his field, including Jean-Jacques Campas and Stephane Terreaux. These collaborations have likely enriched his work and led to further advancements in his inventions.

Conclusion

Patrick Vanhee is a distinguished inventor whose work in metal detection technologies has made a significant impact on the industry. His innovative patents reflect his commitment to advancing technology and improving processes in metal inspection.