Ottawa, Canada

Patrick T Oong

This inventor holds 1 USPTO granted patent. Top assignees: Cornell University, National Research Council of Canada. Active years: 1992.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 1992

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1 patent (USPTO):Explore Patents

Title: Patrick T Oong: Innovator in Anomaly Detection

Introduction

Patrick T Oong is a notable inventor based in Ottawa, Canada. He has made significant contributions to the field of medical diagnostics, particularly in the detection of anomalies in exfoliated cells. His innovative approach utilizes advanced technology to enhance the accuracy of medical assessments.

Latest Patents

Patrick T Oong holds a patent for a method of detecting the presence of anomalies in exfoliated cells using infrared spectroscopy. This method involves directing a beam of infrared light at specimens containing cells, such as those obtained from cervical smears. The detection of anomalies occurs by analyzing changes in infrared absorption, which are indicative of functional group vibrations in nucleic acids, tissue proteins, carbohydrates, and lipid structures. His patent represents a significant advancement in non-invasive diagnostic techniques.

Career Highlights

Throughout his career, Patrick has worked with esteemed institutions, including Cornell University and the National Research Council of Canada. His experience in these organizations has allowed him to collaborate with leading experts in the field and contribute to groundbreaking research.

Collaborations

One of his notable collaborators is Basil Rigas, with whom he has worked on various projects related to medical diagnostics and anomaly detection.

Conclusion

Patrick T Oong's innovative work in the detection of anomalies in exfoliated cells showcases his commitment to advancing medical technology. His contributions have the potential to improve diagnostic accuracy and patient outcomes.

Profile summary based on public USPTO records.
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