Company Filing History:
Years Active: 2007-2011
Title: The Innovative Contributions of Patrick Simpkins
Introduction
Patrick Simpkins is a notable inventor based in Edina, MN (US), recognized for his significant contributions to the field of inspection technology. With a total of four patents to his name, Simpkins has developed innovative solutions that enhance the efficiency and accuracy of inspection systems.
Latest Patents
One of Simpkins' latest patents is titled "Product setup sharing for multiple inspection systems." This invention involves an inspection tool equipped with a camera that captures images of a wafer. The tool's controller is designed to perform various corrections, including light source flat field correction, optical image warping correction, and optical image scale correction. The process ensures that separate inspection tools are calibrated to obtain a consistent response regarding imaging and illumination. Each tool images a standard target, and their responses are normalized to maintain uniformity across the systems. Another significant patent is the "Photoresist edge bead removal measurement." This method determines the edge of a wafer and identifies the location of a wafer notch. It also calculates the distance from the edge of the wafer to an edge bead removal line, ensuring precise measurements for effective processing.
Career Highlights
Throughout his career, Patrick Simpkins has worked with prominent companies in the technology sector, including Rudolph Technologies, Inc. and August Technology Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in inspection technologies.
Collaborations
Simpkins has collaborated with various professionals in his field, including his coworker Cory Watkins. Their joint efforts have led to the development of innovative solutions that address complex challenges in inspection systems.
Conclusion
Patrick Simpkins stands out as a dedicated inventor whose work has significantly impacted the inspection technology landscape. His patents reflect a commitment to innovation and excellence in his field.