Worcester, MA, United States of America

Patrick Schaumont

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Worcester Polytechnic Institute. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Patrick Schaumont. Retrieved from https://idiyas.com/inventor/patrick-schaumont-u9ztsbnn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Patrick Schaumont and Electronic Tampering Detection

Introduction

Patrick Schaumont is an inventor associated with Worcester, Massachusetts, and Worcester Polytechnic Institute. His patent work addresses the security of computing devices against physical tampering.

Latest Patents

Schaumont is credited with 1 patent: “Electronic tampering detection.” The invention describes a method for detecting physical attacks on a computing device by embedding a sensor or field-programmable gate array (FPGA) on a circuit board. The device gathers the frequency response of the board’s power distribution network during operation, then compares a suspected tampering response with responses associated with known tampering events. This comparison supports a determination of whether tampering has occurred.

Career Highlights

Schaumont’s listed affiliation is Worcester Polytechnic Institute. His patent illustrates an approach to hardware security that uses changes in a circuit board’s electrical behavior to help identify physical attacks.

Collaborations

Among Schaumont’s listed coworkers are Shahin Tajik and Tahoura Mosavirik.

Conclusion

Patrick Schaumont’s patent on electronic tampering detection reflects his work on identifying physical attacks through power-network frequency responses, in connection with Worcester Polytechnic Institute.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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