This inventor holds 1 USPTO granted patent. Top assignee: Forensic Technology Wai, Inc.. Active years: 2002.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2002
Title: Patrick Rannou: Innovator in Image Analysis Technology
Introduction
Patrick Rannou is a notable inventor based in Montréal, Canada. He has made significant contributions to the field of image analysis through his innovative patent. His work focuses on enhancing the interface apparatus used in computer systems for data acquisition and image manipulation.
Latest Patents
Patrick Rannou holds a patent for a "Data Acquisition Image Analysis Image Manipulation Interface." This apparatus features three concentric annular rings, with the outermost ring being solid and the two inner rings segmented into four equal arcs. These arcs form pairs of buttons that facilitate the positioning of objects for imaging and the manipulation of images for comparison and analysis. The interface allows users to generate signals to rotate objects or images within a common reference frame. Additionally, the inner rings enable translational motion in four perpendicular directions, enhancing the overall functionality of the device.
Career Highlights
Patrick Rannou is currently employed at Forensic Technology Wai, Inc., where he applies his expertise in image analysis technology. His innovative approach has contributed to advancements in forensic imaging and analysis, making significant impacts in the field.
Collaborations
Patrick collaborates with Jean-François Ouellet, a fellow professional in the industry. Their combined efforts aim to push the boundaries of technology in forensic applications.
Conclusion
Patrick Rannou's contributions to image analysis technology through his innovative patent demonstrate his commitment to advancing the field. His work at Forensic Technology Wai, Inc. continues to influence the way forensic imaging is conducted.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile