Achères, France

Patrick Petit

This inventor holds 1 USPTO granted patent. Top assignee: Ge Medical Systems Global Technology Company, LLC. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Patrick Petit. Retrieved from https://idiyas.com/inventor/patrick-petit-rtpz67qo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Patrick Petit

Introduction

Patrick Petit is a notable inventor based in Acheres, France. He has made significant contributions to the field of X-ray technology. His work focuses on enhancing the efficiency and safety of X-ray emission devices.

Latest Patents

Patrick Petit holds a patent for a "Method and device for X-ray emission with gas trapping." This innovative device features an X-ray tube housed within a protective enclosure filled with an electrically insulating liquid. The design includes at least one chamber connected to the protective enclosure, which effectively traps and purges gas bubbles contained or dissolved in the liquid.

Career Highlights

Patrick Petit is associated with GE Medical Systems Global Technology Company, LLC, where he applies his expertise in medical imaging technology. His work has contributed to advancements in the safety and functionality of X-ray devices.

Collaborations

Throughout his career, Patrick Petit has collaborated with esteemed colleagues such as Jean-Marie Penato and Pierre Fernand Habig. These partnerships have fostered innovation and development in their respective fields.

Conclusion

Patrick Petit's contributions to X-ray technology exemplify the impact of innovative thinking in medical imaging. His patent and work at GE Medical Systems highlight the importance of advancements in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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