This inventor holds 1 USPTO granted patent, plus 1 CIPO patent and 1 EPO patent. Top assignees: Centralesupelec, Universite Dé Lorraine. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
1 out of 26 
1 out of 93 
Years Active: 2026
Title: Patrick Perre - Innovator in Detection Technologies
Introduction: Patrick Perre is an inventor based in Palaiseau, France. He is associated with CentraleSupélec, where he works alongside colleagues Julien Lemaire and Fanny Duval. Although he currently holds no granted patents, his contributions to the field of detection technologies are noteworthy.
Latest Patent Applications: Patrick Perre's latest patent application is titled "Facility for Detecting at Least One Characteristic Parameter of a Medium, and Method for Detecting at Least One Such Characteristic Parameter." This application describes a facility designed to detect various characteristic parameters of a medium. The facility includes a device that illuminates the medium with visible polychromatic light, a device that excites the medium with visible-light or infrared monochromatic radiation, and multiple devices that collect and convey electromagnetic radiation emitted by the medium. Additionally, it features at least one visible-band spectrometer and one Raman spectrometer to obtain the respective spectra of the medium, ultimately allowing for the detection of characteristic parameters.
Conclusion: Patrick Perre is an innovative inventor whose work in detection technologies holds promise for future advancements in the field. His latest patent application reflects his commitment to developing sophisticated methods for analyzing mediums.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile