Patrick Llorens

Title: Innovations by Patrick Llorens in Fault Injection Testing

Introduction

Patrick Llorens is an accomplished inventor based in El Segundo, California. He has made significant contributions to the field of fault injection testing, particularly for field programmable gate array (FPGA) devices. His innovative work has led to the development of methods and systems that enhance the reliability and performance of these devices.

Latest Patents

Llorens holds a patent for "Methods and systems for single-event upset fault injection testing." This patent outlines a comprehensive approach to fault injection testing for FPGA devices. The process involves interfacing with a device under test (DUT), imaging a configuration RAM (CRAM) with a specific configuration image, and injecting single event upsets into the CRAM bits while the DUT operates. The method includes monitoring operations, comparing outputs with a reference FPGA device, and logging error events and CRAM location data associated with the upsets.

Career Highlights

Patrick Llorens is currently employed at Raytheon Company, where he applies his expertise in fault injection testing. His work is crucial in ensuring the reliability of advanced electronic systems. Llorens has demonstrated a commitment to innovation and excellence throughout his career.

Collaborations

Llorens collaborates with talented professionals such as Neal Pollack and Brian Clebowicz. Their combined efforts contribute to the advancement of technology in the field of FPGA devices.

Conclusion

Patrick Llorens is a notable inventor whose work in fault injection testing has made a significant impact on the reliability of FPGA devices. His innovative methods and systems continue to influence the industry positively.