Company Filing History:
Years Active: 2015
Title: The Innovations of Patrick L Thompson
Introduction
Patrick L Thompson is an accomplished inventor based in Laurel, MD (US). He has made significant contributions to the field of optics, particularly in the area of wavefront sensing. His innovative work has led to the development of a unique method for measuring aberrations in optical systems.
Latest Patents
One of Thompson's notable patents is titled "System and method for null-lens wavefront sensing." This patent describes a method of measuring aberrations in a null-lens, which includes assembly and alignment aberrations. The null-lens is utilized for measuring aberrations in aspheric optics. Light propagates from the aspheric optic location through the null-lens while sweeping a detector through the null-lens focal plane. Image data is collected at various locations around the focal plane. The method simulates light propagation to the collection locations for each collected image. Null-lens aberrations can be extracted by applying image-based wavefront sensing to the collected images and simulation results. This innovative approach improves the accuracy of measuring aspheric optic aberrations. Thompson holds 1 patent for this groundbreaking work.
Career Highlights
Patrick L Thompson is currently associated with the United States of America as represented by the Administrator of NASA. His work at NASA has allowed him to explore advanced optical technologies and contribute to significant research in the field.
Collaborations
Thompson has collaborated with notable colleagues, including Peter C Hill and David L Aronstein. Their combined expertise has further enhanced the quality and impact of their research.
Conclusion
Patrick L Thompson's contributions to wavefront sensing and optical measurement techniques have established him as a key figure in the field of optics. His innovative patent demonstrates his commitment to advancing technology and improving measurement accuracy in optical systems.