Fort Mitchell, KY, United States of America

Patrick L Mohney

This inventor holds 1 USPTO granted patent. Top assignee: Sick Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Patrick L Mohney. Retrieved from https://idiyas.com/inventor/patrick-l-mohney

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovations of Patrick L. Mohney

Introduction

Patrick L. Mohney is an accomplished inventor based in Fort Mitchell, KY (US). He has made significant contributions to the field of inspection technology. His work focuses on enhancing the efficiency and accuracy of object detection in conveyance systems.

Latest Patents

Patrick holds a patent for an "Inspection apparatus, system, and method." This invention encompasses systems, apparatuses, methods, and computer program products designed for the inspection of objects or items within a conveyance system. The technology enables the detection of the presence or absence of objects and allows for the determination of various characteristics through image detection of laser lines projected onto the conveyance surface.

Career Highlights

Patrick is currently employed at Sick Inc., where he continues to innovate and develop advanced inspection technologies. His expertise in this area has positioned him as a valuable asset to his company and the industry at large.

Collaborations

Throughout his career, Patrick has collaborated with notable professionals, including Robert Louis Stone and Mohammed Islam. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Patrick L. Mohney's contributions to inspection technology exemplify the impact of innovation in enhancing operational efficiency. His patent and ongoing work at Sick Inc. highlight his commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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