CORNING, NY, United States of America

Patrick Garret Cigno

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Corning Incorporated. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Patrick Garret Cigno. Retrieved from https://idiyas.com/inventor/patrick-garret-cigno

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Patrick Garret Cigno and X-Ray CT Inspection of Honeycomb Ceramics.

Introduction

Patrick Garret Cigno is an inventor based in Corning, New York, and is associated with Corning Incorporated. His patent work addresses the inspection of honeycomb ceramic structures using X-ray computed tomography (CT) imaging.

Latest Patents

Cigno is associated with 1 patent, titled “Systems and Methods for Inspecting Honeycomb Ceramic Structures Using X-Ray CT Imaging.” The invention describes a method for inspecting and manufacturing honeycomb structures. It generates a three-dimensional volume file from X-ray images, reduces that file to two-dimensional data sets, and tracks structural features across those sets. The method then derives a geometric contour for a feature of interest and uses it to create a planar representation. That representation supports the determination of at least one structural condition in the honeycomb structure.

Career Highlights

Cigno’s listed patent work focuses on applying three-dimensional imaging and data analysis to the inspection of honeycomb ceramics. The approach is designed to identify structural features and assess conditions within the material.

Collaborations

Cigno’s listed coworkers include Jerry Lee Hepburn and Corey Thomas Janisch. His work is associated with Corning Incorporated.

Conclusion

Patrick Garret Cigno’s patent describes an X-ray CT-based method for analyzing honeycomb ceramic structures, connecting imaging, geometric feature tracking, and structural assessment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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