Rockville, MD, United States of America

Patrick F Egan


Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 2017-2021

Loading Chart...
5 patents (USPTO):Explore Patents

Title: The Innovations of Patrick F Egan

Introduction

Patrick F Egan is a notable inventor based in Rockville, MD (US). He has made significant contributions to the field of optical technology, holding a total of five patents. His work focuses on developing advanced devices that enhance the understanding and measurement of optical systems.

Latest Patents

One of Patrick F Egan's latest patents is a deformometer designed for determining the deformation of an optical cavity optic. This innovative device includes a cavity body and entry and exit optical cavity optics, which produce filtered combined light. The deformometer utilizes two lasers to provide first and second light, which are then combined using an optical combiner. The combined light is communicated to the entry optical cavity optic. Additionally, a beam splitter receives the filtered combined light and splits it for further analysis. The device features a first light detector that produces a first cavity signal and a second light detector that generates a second cavity signal from the filtered light.

Career Highlights

Patrick F Egan is currently employed by the Government of the United States of America, as represented by the Secretary of Commerce. His work has been instrumental in advancing optical measurement technologies, contributing to both scientific research and practical applications.

Collaborations

Throughout his career, Patrick has collaborated with notable colleagues, including Jay Howard Hendricks and Jack A Stone, Jr. These partnerships have fostered innovation and have led to the development of cutting-edge technologies in the field.

Conclusion

Patrick F Egan's contributions to optical technology through his patents and collaborations highlight his role as a significant inventor in the field. His work continues to influence advancements in optical measurement and technology.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…