The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2017

Filed:

Mar. 20, 2015
Applicant:

National Institute of Standards and Technology, Gaithersburg, MD (US);

Inventors:

Jay H. Hendricks, Clarksburg, MD (US);

Gregory F. Strouse, Frederick, MD (US);

Jacob E. Ricker, Gaithersburg, MD (US);

Douglas A. Olson, North Potomac, MD (US);

Gregory E. Scace, Laytonsville, MD (US);

Jack A. Stone, Silver Spring, MD (US);

Patrick F. Egan, Rockville, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 11/02 (2006.01); G01K 11/00 (2006.01); G01N 21/45 (2006.01);
U.S. Cl.
CPC ...
G01L 11/02 (2013.01); G01K 11/00 (2013.01); G01N 21/45 (2013.01);
Abstract

An article to determine a sample condition includes a substrate; a reference optical cavity disposed on the substrate and comprising a reference cavity, the reference optical cavity being configured to support a reference optical resonance and to maintain an axial length of the reference cavity; and a sample optical cavity disposed on the substrate and comprising a sample cavity, the sample optical cavity being configured to support a sample optical resonance and to maintain an axial length of the sample cavity.


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