Kenosha, WI, United States of America

Patricia May Koeppel

This inventor holds 1 USPTO granted patent. Top assignee: Combex, Inc.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Patricia May Koeppel. Retrieved from https://idiyas.com/inventor/patricia-may-koeppel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Patricia May Koeppel: Innovator in Thermometer Technology

Introduction

Patricia May Koeppel is a notable inventor based in Kenosha, Wisconsin. She has made significant contributions to the field of thermometer technology, particularly with her innovative designs. Her work has been recognized for its practicality and effectiveness in temperature measurement.

Latest Patents

Patricia holds a patent for a dial thermometer, showcasing her expertise in creating user-friendly and accurate temperature measurement devices. This invention reflects her commitment to improving everyday tools that benefit various industries and consumers alike. She has 1 patent to her name.

Career Highlights

Throughout her career, Patricia has worked with Combex, Inc., where she has been able to apply her skills and knowledge in a collaborative environment. Her role at the company has allowed her to focus on developing innovative solutions in the field of thermometry.

Collaborations

Patricia has collaborated with her coworker, Paul Mayer, to enhance the development of her inventions. Their teamwork has contributed to the successful implementation of new technologies within their company.

Conclusion

Patricia May Koeppel's contributions to thermometer technology exemplify her dedication to innovation and improvement in measurement tools. Her work continues to inspire future inventors in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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