This inventor holds 2 USPTO granted patents. Top assignee: Infineon Technologies Ag. Active years: 2008.
Location History:
- Munich, DE (2008)
- München, DE (2008)
Company Filing History:
Years Active: 2008
Title: Patric Stracke: Innovator in Semiconductor Testing
Introduction
Patric Stracke is a notable inventor based in Munich, Germany. He has made significant contributions to the field of semiconductor testing, holding 2 patents that showcase his innovative approaches. His work is primarily associated with Infineon Technologies AG, a leading company in semiconductor solutions.
Latest Patents
Stracke's latest patents include a "Method for testing semiconductor chips by means of bit masks." This method involves a chip with a test logic that executes various test modes, outputting results or statuses from the chip. The process includes providing a chip with multiple register sets, where registers are logically combined to facilitate testing. Another patent, "Method for testing semiconductor chips using register sets," describes a system where different register groups are programmed with bit strings to represent various test modes, allowing for efficient testing and result retrieval.
Career Highlights
Throughout his career, Patric Stracke has focused on enhancing semiconductor testing methodologies. His innovative techniques have contributed to improving the reliability and efficiency of semiconductor chips, which are crucial in various electronic applications.
Collaborations
Stracke has collaborated with notable colleagues such as Udo Hartmann and Jochen Kallscheuer, further enriching his work in the semiconductor industry.
Conclusion
Patric Stracke's contributions to semiconductor testing through his patents reflect his commitment to innovation in technology. His work continues to influence the field, ensuring advancements in semiconductor reliability and performance.