Pat Y Hom

Title: Pat Y Hom: Innovator in Logic Circuitry Testing

Introduction

Pat Y Hom is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of logic circuitry testing. His innovative approach has led to the development of a unique patent that enhances the efficiency of testing logic designs.

Latest Patents

Pat Y Hom holds a patent for "Module level scan testing." This invention involves dividing a design of logic circuitry into one or more discrete logic modules that can be utilized in other circuitry designs. An automated test pattern generator (ATPG) program is applied to these discrete modules, allowing for the generation of ATPG patterns that are reusable in future designs. This innovation streamlines the testing process and improves the overall efficiency of logic circuitry development.

Career Highlights

Pat Y Hom has worked at Chips and Technologies, LLC, where he has been instrumental in advancing testing methodologies for logic circuitry. His expertise in this area has positioned him as a valuable asset to his company and the broader field of electronics.

Collaborations

Pat has collaborated with T Dean Skelton, contributing to the development and refinement of testing techniques in logic circuitry. Their partnership has fostered innovation and improved testing processes within their projects.

Conclusion

Pat Y Hom's contributions to logic circuitry testing through his patent and collaborative efforts highlight his role as an influential inventor in the field. His work continues to impact the efficiency of electronic design and testing methodologies.