This inventor holds 1 USPTO granted patent. Top assignee: Mercury Diagnostics, Inc.. Active years: 1999.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1999
Title: Pat S Lee - Innovator in Blood Analysis Technology
Introduction
Pat S Lee is a notable inventor based in Menlo Park, California. He has made significant contributions to the field of medical diagnostics, particularly in the analysis of whole blood. His innovative work has led to the development of a unique test strip that enhances the accuracy of blood analysis.
Latest Patents
Pat S Lee holds a patent for an "Opaque reaction matrix for the analysis of the whole blood." This invention involves a test strip designed to determine the presence or concentration of an analyte in whole blood. The test strip features a porous membrane that includes a separating agent to isolate red blood cells from the fluid component. Additionally, it incorporates an indicating reagent system that produces a spectrophotometric change upon contact with the fluid component. An opaque filler is also included to minimize spectrophotometric interference caused by red blood cells. This innovative approach allows for more accurate testing of whole blood for various analytes.
Career Highlights
Pat S Lee is associated with Mercury Diagnostics, Inc., where he continues to advance the field of blood analysis technology. His work has been instrumental in developing tools that improve diagnostic accuracy and patient care.
Collaborations
Some of his notable coworkers include Joel Sterling Douglas and Henry M Grage. Their collaborative efforts contribute to the innovative environment at Mercury Diagnostics, Inc.
Conclusion
Pat S Lee's contributions to blood analysis technology exemplify the impact of innovation in medical diagnostics. His patented test strip represents a significant advancement in the field, enhancing the ability to accurately analyze whole blood.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile