Chicago, IL, United States of America

Pat Banerjee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Immersivetouch, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pat Banerjee. Retrieved from https://idiyas.com/inventor/pat-banerjee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Pat Banerjee and Augmented-Reality Guidance for Surgery.

Introduction

Pat Banerjee is an inventor based in Chicago, Illinois, and is associated with ImmersiveTouch, Inc. His patent work focuses on applying augmented reality to operative guidance.

Latest Patents

Banerjee is credited with 1 patent: “System and Method for Rendering Operative Guidance Overlay.” The invention describes receiving image data of a patient’s anatomy and operative instruments, then generating virtual models from that information. Sensor data related to the user, instruments, or patient helps dynamically create guidance overlays. A wearable augmented-reality interface displays the overlays, continuously aligning the virtual anatomical model with the patient and virtual instrument models with the instruments.

Career Highlights

Banerjee’s disclosed patent work connects medical imaging, sensor data, virtual modeling, and wearable augmented-reality technology. The system is designed to present operative guidance in alignment with a patient and surgical instruments.

Collaborations

Banerjee’s listed coworkers include Jia Luo and Chris Orris. His company affiliation is ImmersiveTouch, Inc.

Conclusion

Pat Banerjee’s patent describes an augmented-reality approach to operative guidance that combines patient and instrument models with sensor data for continuous alignment during procedures.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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