Vantaa, Finland

Pasi Toivanen

This inventor holds 1 USPTO granted patent and 1 published patent application and 2 EPO patents. Top assignee: Life Technologies Holdings Pte Limited. Active years: 2025.

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Pasi Toivanen: Innovator in Sample Analysis Technology

Introduction

Pasi Toivanen is a notable inventor based in Vantaa, Finland. He has made significant contributions to the field of sample analysis technology. His innovative approach has led to the development of a patented method that enhances the efficiency of analyzing samples in microplates.

Latest Patents

Pasi Toivanen holds a patent for a "Method of analyzing samples, analyzing device and computer program." This method involves producing electromagnetic radiation with a predetermined wavelength, illuminating a sample in a microplate, and detecting the emitted light. The process includes determining the intensity of light from specific measurement areas and calculating a result value that represents the total light emitted by the sample. This innovative method streamlines the analysis process and improves accuracy.

Career Highlights

Pasi Toivanen is associated with Life Technologies Holdings Pte Limited, where he applies his expertise in sample analysis. His work has been instrumental in advancing technologies that facilitate better research outcomes. With a focus on innovation, he continues to contribute to the scientific community.

Collaborations

Pasi has collaborated with talented individuals such as Adyary Fallarero and Jukka Tuunanen. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Pasi Toivanen's contributions to sample analysis technology exemplify the impact of innovation in scientific research. His patented methods and collaborative efforts continue to shape the future of analysis in various fields.

Profile summary based on public USPTO records.
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