Fountain Valley, CA, United States of America

Pascale D Endo

This inventor holds 2 USPTO granted patents. Top assignee: Ethicon, Gmbh. Active years: 2002-2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pascale D Endo. Retrieved from https://idiyas.com/inventor/pascale-d-endo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 30(Granted Patents)


Company Filing History:


Years Active: 2002-2005

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2 patents (USPTO):Explore Patents

Title: Innovations of Pascale D Endo

Introduction

Pascale D Endo is an accomplished inventor based in Fountain Valley, CA (US). He holds two patents that showcase his expertise in chemical indicators. His work is significant in the field of detecting oxidizing agents, which has various applications in safety and quality control.

Latest Patents

Pascale's latest patents include a "Chemical Indicator" and a "Method of Indicating an Oxidizing Agent." Both inventions utilize a chemical indicator of an aurin moiety in a substrate to effectively detect the presence of an oxidizing agent. These innovations contribute to advancements in chemical detection technologies.

Career Highlights

Pascale D Endo is currently employed at Ethicon GmbH, where he continues to develop innovative solutions in his field. His work at Ethicon reflects his commitment to enhancing safety and efficiency in chemical applications.

Collaborations

Pascale has collaborated with notable coworkers, including Thomas G Lippold and Nitu Kohli, who is a talented woman in the field. Their teamwork fosters a creative environment that drives innovation.

Conclusion

Pascale D Endo's contributions to the field of chemical indicators demonstrate his dedication to innovation and safety. His patents reflect a significant advancement in detecting oxidizing agents, showcasing the impact of his work in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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