Verlaine, Belgium

Pascal Waroux

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Cockerill Maintenance & Ingéniérie S.a., Universitéde Liége. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pascal Waroux. Retrieved from https://idiyas.com/inventor/pascal-waroux

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Innovations of Pascal Waroux

Introduction

Pascal Waroux is a notable inventor based in Verlaine, Belgium. He has made significant contributions to the field of interferometry and shearography. His work focuses on developing advanced measurement systems that enhance industrial testing processes.

Latest Patents

Waroux holds a patent for a "Low coherence interferometric system for phase stepping shearography combined with 3D profilometry." This invention relates to a portable industrial instrument designed to perform interferometric fringe projection and shearography in an integrated manner. The instrument is capable of measuring the 3D shape of an object using the moiré method and can also conduct shearographic measurements by reversing the direction of the traversing light beam.

Career Highlights

Throughout his career, Waroux has worked with prominent organizations such as Cockerill Maintenance & Ingénierie S.A. and Université de Liège. His experience in these institutions has allowed him to refine his skills and contribute to innovative projects in the field of engineering.

Collaborations

Waroux has collaborated with notable professionals in his field, including Pascal Blain and Yvon Renotte. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

Pascal Waroux's contributions to the field of interferometry and shearography demonstrate his commitment to innovation and excellence. His patented inventions and collaborative efforts continue to influence industrial measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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