The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2014
Filed:
Dec. 04, 2012
Pascal Blain, Liège, BE;
Yvon Renotte, Embourg, BE;
Serge Habraken, Comblain-au-Pont, BE;
Pascal Waroux, Verlaine, BE;
Pascal Blain, Liège, BE;
Yvon Renotte, Embourg, BE;
Serge Habraken, Comblain-au-Pont, BE;
Pascal Waroux, Verlaine, BE;
Cockerill Maintenance & Ingenierie S.A., Seraing, BE;
Universite de Liege, Liege, BE;
Abstract
The present invention relates to a portable industrial instrument for performing, in an integrated and two-way manner, an interferometric fringe projection and shearography, on a object to be tested, so that, when the two-way interferometer () is associated with the coherent or quasi-coherent projection device (), the instrument is able to measure the 3D shape of the object by interferometric fringe projection, also known as moiré method, and, when the two-way interferometer () is associated with the recording or imaging device (), the instrument is able to perform shearographic measurements on the object, the direction of the traversing light beam in the interferometer () being reversed when shifting from one measurement configuration to the other one.