Moissy-Cramayel, France

Pascal Léon Georges Beilvert

This inventor holds 1 USPTO granted patent. Top assignee: Safran Aircraft Engines. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pascal Léon Georges Beilvert. Retrieved from https://idiyas.com/inventor/pascal-léon-georges-beilvert

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Pascal Léon Georges Beilvert: Turbine-Engine Airflow Measurement

Introduction

Pascal Léon Georges Beilvert is an inventor associated with Safran Aircraft Engines in Moissy-Cramayel, France. His patent work includes a device designed to measure airflow characteristics within a turbine engine.

Latest Patents

Beilvert is associated with 1 patent: “Device for Measuring the Characteristics of an Air Flow.” The invention is intended for installation in an annular duct with a longitudinal axis in a turbine engine. It uses structurally independent supports, each carrying measuring equipment. The first support’s main branch extends farther in a shared direction than the second support’s branch, providing a distinct arrangement for the airflow-measuring components.

Career Highlights

Beilvert’s recorded patent reflects work on measurement technology for turbine-engine airflow. The invention’s support structure is designed to position separate measuring means within the engine’s annular duct.

Collaborations

Beilvert’s listed coworkers include Florian Joseph Bernard Kockenpo and Thibault Xavier Alexis Berranger. His company affiliation is Safran Aircraft Engines.

Conclusion

Pascal Léon Georges Beilvert’s patent documents a turbine-engine airflow measurement device with independently supported measuring components, highlighting his contribution to aircraft-engine technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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