This inventor holds 1 USPTO granted patent. Top assignee: Thomson-Csf. Active years: 2000.
Company Filing History:
Years Active: 2000
Title: The Innovations of Pascal Krapf
Introduction
Pascal Krapf is a notable inventor based in Forbach, France. He is recognized for his contributions to the field of electromagnetic wave detection. His innovative work has led to the development of a unique patent that addresses specific technological needs.
Latest Patents
Krapf holds a patent for a bispectral electromagnetic wave detector. This invention includes at least one first and one second overlaid plane active detector element, which are separated by a common layer. The first and second detector elements are sensitive to different wavelengths. The device features a first means of connection that is common to both detector elements, along with additional means of connection for each element. It also includes mechanisms for applying control voltages and detecting photoconduction currents. This invention is particularly useful in applications that require the detection of electromagnetic waves in two bands of different wavelengths.
Career Highlights
Pascal Krapf has made significant strides in his career, particularly through his work at Thomson-CSF. His innovative spirit and technical expertise have positioned him as a key figure in the development of advanced detection technologies.
Collaborations
Krapf has collaborated with notable colleagues, including Eric Costard and Philippe Bois. Their combined efforts have contributed to the advancement of technologies in their field.
Conclusion
Pascal Krapf's work exemplifies the spirit of innovation in electromagnetic wave detection. His contributions continue to influence the industry and pave the way for future advancements.