Greensboro, NC, United States of America

Pascal Brisson

This inventor holds 1 USPTO granted patent. Top assignee: Honda Patents & Technologies North America, LLC. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pascal Brisson. Retrieved from https://idiyas.com/inventor/pascal-brisson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Pascal Brisson and Flight Control System Testing

Introduction

Pascal Brisson is an inventor associated with Greensboro, North Carolina, and Honda Patents & Technologies North America, LLC. His patent work addresses testing aircraft flight control systems by applying controlled hinge moments.

Latest Patents

Brisson is credited with 1 patent: “Flight Control System Loading Test Apparatus and Method.” The invention uses a surface-mounted sector attached to an aircraft flight control system body, a rotatable cam profile sector, a dummy weight, and a cable. The cam’s profile surface has curves with different radii, allowing the applied hinge moment to vary as the cam rotates among loading positions. This arrangement provides a way to test flight control systems under different loading conditions.

Career Highlights

Brisson’s listed patent reflects work on mechanical test equipment for aircraft flight controls. The apparatus is designed to vary loading through the interaction of its cam profile, cable, and dummy weight.

Collaborations

Brisson’s listed coworkers include Hiroshi Yamanouchi and Toshiaki Fujii. The available information identifies them as coworkers but does not specify their roles in the patent.

Conclusion

Pascal Brisson’s patent describes a configurable apparatus for applying varying hinge moments during aircraft flight control system testing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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