Hefei, China

Panpan Du

This inventor holds 1 USPTO granted patent. Top assignee: Hefei Visionox Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Panpan Du. Retrieved from https://idiyas.com/inventor/panpan-du

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Panpan Du: Innovator in Image Acquisition Technology

Introduction

Panpan Du is a notable inventor based in Hefei, China. He has made significant contributions to the field of image acquisition technology. His innovative approach has led to the development of a unique method that enhances the efficiency of image capturing systems.

Latest Patents

Panpan Du holds a patent for an "Image acquisition method and system, and display panel." This invention involves acquiring N images of an object using N shooting devices, each with different fields of view. The method includes feature extraction from the N images to obtain M features, where M is an integer multiple of N. This innovative approach allows for a more comprehensive analysis of the captured images.

Career Highlights

Panpan Du is currently employed at Hefei Visionox Technology Co., Ltd. His work at this company has been instrumental in advancing image acquisition technologies. His dedication to innovation has positioned him as a key figure in his field.

Collaborations

Panpan collaborates with talented individuals such as Dandan Sun and Lei An. Their combined expertise fosters a creative environment that drives technological advancements.

Conclusion

Panpan Du's contributions to image acquisition technology exemplify the spirit of innovation. His patent and work at Hefei Visionox Technology Co., Ltd. highlight his commitment to advancing this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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