Bengaluru, India

Pankaj Gulhane

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Yahoo! Inc.. Active years: 2013.

USPTO Granted Patents = 1 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Pankaj Gulhane: Innovator in Similarity Scoring Systems

Introduction

Pankaj Gulhane is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of technology, particularly in developing methods for determining similarity scores between attribute values. His innovative approach has the potential to enhance data matching processes across various applications.

Latest Patents

Pankaj holds a patent titled "Method and system for determining similarity score." This patent describes a method that involves generating matching patterns for pairs of attribute values. The process includes identifying matching segments between these values and computing a similarity score based on specific criteria. His work in this area demonstrates a sophisticated understanding of data analysis and pattern recognition.

Career Highlights

Pankaj is currently employed at Yahoo! Inc., where he applies his expertise in technology and innovation. His role at the company allows him to work on cutting-edge projects that leverage his skills in data processing and algorithm development. With a patent portfolio that includes 1 patent, he continues to push the boundaries of what is possible in his field.

Collaborations

Pankaj collaborates with talented professionals such as Srinivasan Hanumantha Rao Sengamedu and Ashwin Devendrappa Tengli. These partnerships enhance his work and contribute to the innovative environment at Yahoo! Inc.

Conclusion

Pankaj Gulhane is a distinguished inventor whose work in similarity scoring systems exemplifies the intersection of technology and innovation. His contributions are paving the way for advancements in data matching and analysis.

Profile summary based on public USPTO records.
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