Westmeath, Ireland

Padraig Butler

This inventor holds 1 USPTO granted patent. Top assignee: Mv Research Limited. Active years: 2007.


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Innovations of Padraig Butler in Machine Vision Technology

Introduction

Padraig Butler is an accomplished inventor based in Westmeath, Ireland. He has made significant contributions to the field of machine vision technology, particularly in the measurement of heights of items. His innovative approach has led to the development of a unique patent that enhances the efficiency of solder deposit measurements.

Latest Patents

Padraig Butler holds a patent for a machine vision system designed for measuring heights of items. This system utilizes two laser sources to illuminate a solder deposit from both sides, ensuring comprehensive coverage without occlusion. The camera in this system is equipped with an FGPA programmed to define a subset of the sensor array as a region of interest for processing with each laser source. This innovative design reduces the amount of data transfer and processing required, making the system more efficient.

Career Highlights

Padraig Butler has been instrumental in advancing machine vision technology through his work at Mv Research Limited. His expertise in this area has allowed him to develop solutions that address specific challenges in the industry. His dedication to innovation is evident in his patent and the impact it has on the field.

Collaborations

Padraig has collaborated with notable colleagues, including John Milroy and Peter Conlon. Their combined efforts have contributed to the success of various projects within the company.

Conclusion

Padraig Butler's contributions to machine vision technology exemplify the spirit of innovation. His patent for a machine vision system showcases his ability to solve complex problems in the industry. Through his work at Mv Research Limited, he continues to push the boundaries of technology and improve measurement techniques.

Profile summary based on public USPTO records.
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