Atlanta, GA, United States of America

Padmashree Rida

This inventor holds 1 USPTO granted patent. Top assignee: The Georgia State University Research Foundation, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Padmashree Rida. Retrieved from https://idiyas.com/inventor/padmashree-rida

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Padmashree Rida and a Patent for Assessing DCIS Recurrence Risk.

Introduction

Padmashree Rida is an inventor associated with The Georgia State University Research Foundation, Inc., in Atlanta, Georgia. His patent work addresses a method for assessing the risk of local recurrence in ductal carcinoma in situ (DCIS) and other non-invasive carcinomas in situ.

Latest Patents

Rida is associated with 1 patent, titled “Quantitative Centrosomal Amplification Score to Predict Local Recurrence of Ductal Carcinoma in Situ.” The invention describes evaluating the severity and frequency of numerical and structural centrosome amplification in a tissue sample and using those findings to calculate a centrosomal amplification score (CAS). The score is intended to provide a measure of a patient’s 10-year risk of local recurrence.

Career Highlights

The patent reflects work at the intersection of cancer research and quantitative risk assessment. By translating centrosome amplification characteristics into a score, the disclosed approach aims to support evaluation of recurrence risk for DCIS and related conditions.

Collaborations

Rida’s listed coworker is Karuna Mittal. The available information identifies both her collaboration and the Georgia State University Research Foundation, Inc., but does not specify their individual roles in developing the patent.

Conclusion

Padmashree Rida’s patent focuses on a quantitative approach to estimating local recurrence risk in DCIS, using centrosome amplification measurements to inform a 10-year risk profile.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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