Vaasa, Finland

Paavo Mäkelä

This inventor holds 1 USPTO granted patent. Top assignee: Epec Oy. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Paavo Mäkelä. Retrieved from https://idiyas.com/inventor/paavo-mäkelä

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Paavo Mäkelä: Innovator in Data Processing Equipment

Introduction

Paavo Mäkelä is a notable inventor based in Vaasa, Finland. He has made significant contributions to the field of data processing equipment. His innovative spirit and dedication to technology have led to the development of a unique patent.

Latest Patents

Mäkelä holds a patent for a casing designed specifically for data processing equipment. This invention showcases his ability to address the needs of modern technology and improve the functionality of data systems. He has 1 patent to his name, reflecting his commitment to innovation.

Career Highlights

Paavo Mäkelä is currently employed at Epec Oy, a company known for its advanced technology solutions. His role at Epec Oy allows him to work on cutting-edge projects that push the boundaries of data processing capabilities. His expertise in this area has made him a valuable asset to the company.

Collaborations

Mäkelä collaborates with Tuomo Yli-Taipalus, a fellow innovator at Epec Oy. Together, they work on various projects that aim to enhance the efficiency and effectiveness of data processing technologies.

Conclusion

Paavo Mäkelä is a distinguished inventor whose work in data processing equipment has made a significant impact in the field. His patent and collaboration with talented colleagues highlight his dedication to innovation and technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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