P J DeGroot

Title: Biography of P J DeGroot

Introduction

P J DeGroot is an accomplished inventor based in Seattle, WA (US), known for his significant contributions to optical metrology. With a focus on precision measurement techniques, he has developed innovative methods that enhance the accuracy of optical measurements.

Latest Patents

P J DeGroot holds two patents, including:

1. **Optical thickness profiler using synthetic wavelengths** - This invention involves an optical metrology method and apparatus that generates and separates three optical wavelengths of fixed polarization into a reference beam and a measurement beam. The technology allows for precise measurement of optical path lengths, thickness, and index of refraction across objects.

2. **Three wavelength optical measurement apparatus and method** - This patent describes a method where three optical wavelengths are generated and separated into a reference beam and an object beam. The differences in intensities measured by sensors provide insights into the displacement of the object being measured, improving measurement precision while maintaining a large dynamic range.

Career Highlights

P J DeGroot is currently employed at Hughes Danbury Optical Systems, Inc., where he applies his expertise in optical technologies to develop advanced measurement systems. His work has significantly impacted the field of optical metrology, leading to enhanced measurement capabilities.

Collaborations

Throughout his career, P J DeGroot has collaborated with notable colleagues, including H Eugene Waldenmaier and