Sandnes, Norway

Oyvind Yrke

This inventor holds 1 USPTO granted patent. Top assignee: Geco A.s.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Oyvind Yrke. Retrieved from https://idiyas.com/inventor/oyvind-yrke-1borm5hp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 53(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Oyvind Yrke: Innovator in Seismic Data Processing

Introduction

Oyvind Yrke is a notable inventor based in Sandes, Norway. He has made significant contributions to the field of seismic data processing. His innovative approach has led to the development of a unique method that enhances the understanding of seismic data.

Latest Patents

Oyvind holds a patent for a "Method of processing seismic data to obtain the travel time curve." This patent represents a significant advancement in the field, showcasing his expertise and dedication to innovation. He has 1 patent to his name, reflecting his commitment to improving seismic data analysis.

Career Highlights

Oyvind is currently employed at Geco AS, a company known for its expertise in geophysical services. His work at Geco AS has allowed him to apply his innovative methods in a practical setting, contributing to the company's success in the industry.

Collaborations

Throughout his career, Oyvind has collaborated with talented individuals such as Lars Sonneland and Per Ola Tennebo. These collaborations have fostered a creative environment that encourages the exchange of ideas and advancements in seismic data processing.

Conclusion

Oyvind Yrke is a distinguished inventor whose work in seismic data processing has made a lasting impact on the field. His innovative methods and collaborations with industry professionals continue to drive advancements in geophysical services.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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