Austin, TX, United States of America

Owen Hehmeyer

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Momentum Technical Consulting, Inc.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Owen Hehmeyer. Retrieved from https://idiyas.com/inventor/owen-hehmeyer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile



Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Owen Hehmeyer: Inventor in Chemical-Mechanical Polishing

Introduction

Owen Hehmeyer is an inventor based in Austin, Texas. His patent work addresses vibration measurement and control during chemical-mechanical polishing (CMP), a process used to polish wafers.

Latest Patents

Hehmeyer is credited with 1 patent, titled “Method of and Apparatus for Chemical-Mechanical Polishing.” The invention measures vibration-related variations in the forces holding a wafer against a polishing pad and/or moving the pad and wafer relative to one another. It uses the standard deviation of those measurements to help minimize or eliminate the harmful effects of vibration during CMP.

Career Highlights

Hehmeyer is associated with Momentum Technical Consulting, Inc. His patented work focuses on improving CMP operations by using vibration measurements to address process disturbances.

Collaborations

His listed coworkers include Ralf B. Lukner and Ivan Kosik.

Conclusion

Owen Hehmeyer’s patent describes a measurement-based approach to reducing vibration-related effects in chemical-mechanical polishing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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