This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Istituto Nazionale Di Astrofisica. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019
Title: Osvaldo Catalano: Innovator in Muon Imaging Technology
Introduction
Osvaldo Catalano is a distinguished inventor based in Rome, Italy. He has made significant contributions to the field of non-invasive inspection technologies. His innovative work focuses on utilizing muon imaging for the inspection of solid bodies.
Latest Patents
Catalano holds a patent for an "Apparatus and method for non-invasive inspection of solid bodies by muon imaging." This apparatus is designed to intercept a muon flux associated with cosmic rays as they pass through a body that needs inspection. The system includes sensor means that detect photons or Cherenkov radiation linked to the intercepted muon flux. The electronic processing means reconstruct the energy and direction of the muon flux to calculate the local density of the inspected body. The receiver features an optical device with a receiving surface that has reflecting and/or diffractive properties, which directs the Cherenkov radiation toward the sensor means. The multipixel detection chamber provides an annular image of the muon, with its radius and position varying based on the energy and direction of the muon flux.
Career Highlights
Catalano is affiliated with the Istituto Nazionale di Astrofisica, where he continues to advance his research and development in muon imaging technologies. His work has the potential to revolutionize non-invasive inspection methods across various industries.
Collaborations
He has collaborated with notable colleagues, including Paolo Conconi and Giancarlo Cusumano, who share his passion for advancing scientific knowledge and technology.
Conclusion
Osvaldo Catalano's innovative contributions to muon imaging technology exemplify the intersection of science and practical application. His work not only enhances inspection methods but also paves the way for future advancements in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile