Murayama, Japan

Osamu Ono

This inventor holds 4 USPTO granted patents. Top assignees: 3M Innovative Properties Company, Toyota Jidosha Kabushiki Kaisha. Active years: 2018-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Osamu Ono. Retrieved from https://idiyas.com/inventor/osamu-ono-zss1p078

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.5

ph-index = 4

Forward Citations = 24(Granted Patents)


Location History:

  • Murayama, JP (2018)
  • Yamagata-Pref., JP (2020)

Company Filing History:


Years Active: 2018-2020

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4 patents (USPTO):Explore Patents

Title: The Innovations of Osamu Ono

Introduction

Osamu Ono is a notable inventor based in Murayama, Japan. He has made significant contributions to the field of technology, particularly with his innovative designs and patents. With a total of 4 patents to his name, Ono has established himself as a key figure in the industry.

Latest Patents

One of his latest inventions is the conductive sticker, which showcases his ability to blend functionality with practicality. This invention has the potential to revolutionize various applications in electronics and beyond.

Career Highlights

Throughout his career, Osamu Ono has worked with prominent companies such as 3M Innovative Properties Company and Toyota Jidosha Kabushiki Kaisha. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking projects.

Collaborations

Ono has collaborated with talented individuals in the field, including Yoshimasa Takeda and Takeshi Kondo. These partnerships have fostered a creative environment that has led to innovative solutions and advancements.

Conclusion

Osamu Ono's contributions to technology through his patents and collaborations highlight his role as an influential inventor. His work continues to inspire future innovations in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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