Tokyo, Japan

Osamu Okitsu

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignees: Miyake Clinic, Screen Holdings Co., Ltd.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Osamu Okitsu. Retrieved from https://idiyas.com/inventor/osamu-okitsu-urm8k9w0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Osamu Okitsu: Innovator in Fertilized Egg Development Stage Determination

Introduction

Osamu Okitsu is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of reproductive technology, particularly in the area of fertilized egg development.

Latest Patents

Okitsu holds a patent for a method of determining the development stage of a fertilized egg. This innovative method involves obtaining image data from an optical microscope, extracting relevant regions from the image, and calculating index values that indicate the degree of coincidence and thickness of the fertilized egg's zona pellucida. The development stage is then determined based on these index values and pre-established criteria.

Career Highlights

Throughout his career, Okitsu has worked with prominent organizations, including Screen Holdings Co., Ltd. and Miyake Clinic. His work has been instrumental in advancing techniques related to fertilized egg assessment.

Collaborations

Okitsu has collaborated with notable colleagues such as Ryo Hasebe and Yasushi Kuromi, contributing to the development of innovative solutions in his field.

Conclusion

Osamu Okitsu's work in the determination of fertilized egg development stages showcases his dedication to advancing reproductive technology. His innovative methods and collaborations highlight the importance of research and development in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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