Osamu Kuromiya

Title: Osamu Kuromiya and His Semiconductor Memory Device Patent.

Introduction

Osamu Kuromiya is an inventor associated with Hyogo, Japan. His patent work includes a semiconductor memory device designed to support testing of memory operations.

Latest Patents

The available information identifies one patent associated with Kuromiya: “Semiconductor Memory Device Having Selection Circuit for Arbitrarily [Selecting].” The device includes circuits that detect test modes, generate a clock signal at a prescribed interval, and latch an address when the row address strobe signal falls. In self-disturb test mode, a row decoder uses the clock signal to repeatedly select the word line corresponding to the latched address. This arrangement enables repeated testing of a selected memory location. Kuromiya’s listed patent count is 1 patent.

Career Highlights

Kuromiya is associated with Mitsubishi Denki Kabushiki Kaisha, commonly known as Mitsubishi Electric Corporation, and Mitsubishi Electric Engineering Company, Limited. His patent reflects work on semiconductor memory testing and control circuitry.

Collaborations

His listed coworkers include Goro Hayakawa and Susumu Tanida.

Conclusion

Osamu Kuromiya’s recorded invention focuses on a semiconductor memory device that repeatedly selects a latched address during self-disturb testing, connecting his patent work with his associations in the Mitsubishi group.