Timrat, Israel

Ori Yakov Dangur

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Spinframe Technologies Ltd. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ori Yakov Dangur. Retrieved from https://idiyas.com/inventor/ori-yakov-dangur

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ori Yakov Dangur: Vehicle Inspection Innovation.

Introduction

Ori Yakov Dangur is an inventor based in Timrat, Israel. His patent work includes an automated system for inspecting vehicle exteriors. He is associated with Spinframe Technologies Ltd. and has 1 patent.

Latest Patents

Dangur’s patent, “System and Method for Automatic Inspection of Vehicles,” describes an inspection station designed to examine a vehicle’s exterior. Its deployable structure forms two adjacent compartments. The first compartment provides an inner space for vehicles to enter and exit while helping shield that space from ambient light. It contains an optical imaging system that captures vehicle images and generates image data.

A control system in the second compartment communicates with the inspection system. It processes and analyzes the image data to produce information indicating the vehicle’s status.

Career Highlights

Dangur’s documented patent contribution focuses on automated vehicle inspection. The invention combines a deployable inspection structure, optical imaging, and data analysis to support vehicle-status assessment.

Collaborations

Dangur is associated with Spinframe Technologies Ltd. His listed coworkers include David Grun and Avihu Meir Gamliel.

Conclusion

Ori Yakov Dangur’s patent presents an automated approach to inspecting vehicle exteriors by combining imaging technology with control-system analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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