Tel Aviv, Israel

Or Bar-shira

This inventor holds 1 USPTO granted patent. Top assignee: Yeda Research and Development Co. Ltd. Active years: 2026.


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Or Bar-shira: Innovator in Ultrasound Technology

Introduction

Or Bar-shira is a prominent inventor based in Tel Aviv, Israel. He has made significant contributions to the field of medical imaging, particularly in ultrasound technology. His innovative work focuses on enhancing breast lesion characterization through advanced imaging techniques.

Latest Patents

Or Bar-shira holds a patent for a groundbreaking invention titled "Learned super resolution ultrasound for improved breast lesion characterization." This ultrasound scanning system incorporates an ultrasound scanner, a trained sparse recovery neural network, and a super resolution image generator. The system views a patient after the intravenous injection of microbubbles and generates a sequence of ultrasound images. This sequence consists of both B-mode ultrasound images and contrast-enhanced ultrasound images. The trained sparse recovery neural network is designed to generate super-resolved images of microbubble locations, significantly improving the visualization of microvasculature.

Career Highlights

Throughout his career, Or Bar-shira has demonstrated a commitment to advancing medical imaging technologies. His work has the potential to improve diagnostic accuracy and patient outcomes in breast cancer detection and characterization.

Collaborations

Or collaborates with notable professionals in the field, including his coworker Yonina Eldar. Their combined expertise contributes to the development of innovative solutions in ultrasound technology.

Conclusion

Or Bar-shira is a key figure in the advancement of ultrasound imaging, with a focus on improving breast lesion characterization. His patented technology represents a significant step forward in medical diagnostics.

Profile summary based on public USPTO records.
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