Tel Aviv, Israel

Omri Arnon

This inventor holds 1 USPTO granted patent. Top assignee: Sentinelone, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Omri Arnon. Retrieved from https://idiyas.com/inventor/omri-arnon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Omri Arnon: Inventor in Endpoint Monitoring and Digital Forensics

Introduction

Omri Arnon is an inventor based in Tel Aviv, Israel, and works at SentinelOne, Inc. His patent work addresses endpoint monitoring and the collection and analysis of digital forensic artifacts. He is associated with 1 patent.

Latest Patents

Arnon’s patent, “Remote Operations Forensics,” describes methods for collecting endpoint monitoring data and forensic artifacts using the same agent. The disclosure includes chunking artifacts before transferring them to a cloud server, categorizing and processing artifacts according to their type, and operating the agent in memory without writing to disk. It also describes cloud-based analysis features, including natural-language queries, summaries, and identification of the most relevant monitoring data or forensic artifacts.

Career Highlights

Arnon’s disclosed invention focuses on combining endpoint monitoring with forensic artifact collection while addressing how data is handled and transferred. The patent describes approaches intended to support cloud analysis while limiting disk writes during agent operation and artifact transfer.

Collaborations

Arnon’s listed coworkers include Matan-El Barnes and Amit Zimbalist. The patent disclosure concerns technology associated with SentinelOne, Inc.

Conclusion

Omri Arnon’s patent work centers on remote forensic operations, combining endpoint data collection with cloud-based analysis and tools for finding relevant information.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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