Cockeysville, MD, United States of America

Omid Athari

This inventor holds 1 USPTO granted patent and 1 published patent application and 2 EPO patents. Top assignee: Sick Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Omid Athari. Retrieved from https://idiyas.com/inventor/omid-athari

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovations of Omid Athari

Introduction

Omid Athari is a notable inventor based in Cockeysville, Maryland. He has made significant contributions to the field of object detection technology. His work focuses on enhancing the efficiency of systems that manage the movement of items along conveying paths.

Latest Patents

Omid Athari holds a patent for a "System, apparatus, and method for object edge detection." This innovative technology is designed to detect overlapped items in a sequence of items moving along a conveying path. It utilizes rigidity and thickness contour measurements to improve accuracy in detection.

Career Highlights

Omid Athari is currently employed at Sick Inc., a company known for its advancements in sensor technology and automation solutions. His role involves developing cutting-edge technologies that enhance operational efficiency in various industries.

Collaborations

Omid has collaborated with talented individuals such as Robert Louis Stone and Mohammed Islam. These partnerships have contributed to the development of innovative solutions in the field of object detection.

Conclusion

Omid Athari's contributions to the field of object detection technology exemplify his commitment to innovation. His patent and work at Sick Inc. highlight his role as a key player in advancing automation solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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