Ramat Gan, Israel

Omer Deutsch

This inventor holds 2 USPTO granted patents. Top assignees: Albaad Massuot Vitzhak Ltd., Albaad Massuot Yitzhak Ltd.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Omer Deutsch. Retrieved from https://idiyas.com/inventor/omer-deutsch-04ce0giv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 29(Granted Patents)


Company Filing History:


Years Active: 2012

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2 patents (USPTO):Explore Patents

Title: Omer Deutsch - Innovator in Tampon Applicator Technology

Introduction

Omer Deutsch is a notable inventor based in Ramat Gan, Israel. He has made significant contributions to the field of personal care products, particularly with his innovative designs for tampon applicators. With a total of two patents to his name, Deutsch has demonstrated his commitment to enhancing user experience in this essential product category.

Latest Patents

Omer Deutsch's latest patents focus on the design and functionality of tampon applicators. These inventions aim to improve the ease of use and comfort for consumers, showcasing his dedication to innovation in personal hygiene.

Career Highlights

Throughout his career, Omer Deutsch has worked with prominent companies in the industry. He has been associated with Albaad Massuot Vitzhak Ltd. and Albaad Massuot Yitzhak Ltd., where he has contributed his expertise in product development and innovation.

Collaborations

Omer has collaborated with fellow inventor Amit Avigdor, working together to push the boundaries of product design and functionality in their field.

Conclusion

Omer Deutsch is a talented inventor whose work in tampon applicator technology has made a significant impact on the industry. His innovative spirit and dedication to improving personal care products continue to inspire advancements in this essential area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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