Tarrytown, NY, United States of America

Omar Khalaf

This inventor holds 1 USPTO granted patent. Top assignee: Siemens Healthcare Diagnostics Gmbh. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Omar Khalaf. Retrieved from https://idiyas.com/inventor/omar-khalaf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Omar Khalaf - Innovator in Motion Control Systems

Introduction

Omar Khalaf is a notable inventor based in Tarrytown, NY (US). He has made significant contributions to the field of motion control systems, particularly through his innovative patent that addresses backlash compensation.

Latest Patents

Omar Khalaf holds a patent titled "Backlash compensation in motion control systems." This invention presents a method for compensating backlash in motion control systems. The process involves homing a payload and executing a tooth-pitch non-uniformity procedure to identify necessary corrections. A backlash lookup table is generated to facilitate backlash correction during normal operations. This table is created through a training process that includes selecting a move sequence and computing backlash measurements, which are then stored for future reference.

Career Highlights

Omar Khalaf is currently employed at Siemens Healthcare Diagnostics GmbH, where he applies his expertise in motion control systems. His work has been instrumental in enhancing the performance and reliability of various diagnostic technologies.

Collaborations

Omar collaborates with esteemed colleagues, including David G. Henderson and Narayanan Ramakrishnan. Their combined efforts contribute to the advancement of innovative solutions in their field.

Conclusion

Omar Khalaf's contributions to motion control systems through his patent demonstrate his commitment to innovation and excellence. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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